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GaN: Built for lifetime reliability

説明

2020年 6月 12日

Take a tour behind the scenes from TI's GaN labs to learn more about how TI is leading GaN reliability. With over 30 million device reliability hours and counting, our GaN is built and tested for lifetime reliability. This video focuses on TI GaN intrinsic reliability tests, as well as in-application stress testing in the harshest switching environments.

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