How to design high-accuracy CT-based split-phase electricity meters using standalone metrology ADCs

メール

1.2 Metrology architecture options: SoCs, AFEs, and standalone ADCs

説明

2019年 3月 26日
This module discusses three different architectures for sensing the voltage and current samples used to calculate the metrology parameters. These architectures involve using a SoC, metrology AFE, or standalone ADC. The advantages of the standalone ADC architecture compared to the other two architectures is discussed. 

追加情報

arrow-topclosedeletedownloadmenusearchsortingArrowszoom-inzoom-out arrow-downarrow-uparrowCircle-leftarrowCircle-rightblockDiagramcalculatorcalendarchatBubble-doublechatBubble-personchatBubble-singlecheckmark-circlechevron-downchevron-leftchevron-rightchevron-upchipclipboardclose-circlecrossReferencedashdocument-genericdocument-pdfAcrobatdocument-webevaluationModuleglobehistoryClockinfo-circlelistlockmailmyTIonlineDataSheetpersonphonequestion-circlereferenceDesignshoppingCartstartoolsvideoswarningwiki