A short training on ESD and Surge Events followed by an overview of TI's high performance ESD diodes and TI's Flat Clamp Surge diode portfolio

This 3 minute video demonstrates one of the most common failure mechanisms in USB Type-C ports using TI’s new port protection device and reference design.

In this session we will discuss about protection relay modules and secondary protection solutions that can be considered for these modules.

Flat-clamp TVS reference descriptions for Power supply, HMI , Analog Input/output , digital input and High/Low side digital output and Communication interface

Bi-directional, dual active bridge reference design for level 3 electric vehicle charging stations.

This video discusses the industry's leading USB short-to-battery protection for automotive applications.

Learn how new TI solutions can help you protect USB Type-C ports by integrating 20-V short-to-VBUS protection and IEC ESD protection in a single chip.

Learn how new TI solutions can help you protect USB Type-C ports by integrating 20-V short-to-VBUS protection and IEC ESD protection in a single chip.

Roger Liang, a systems engineer at Texas Instruments, explains what Electrostatic Discharge (ESD) is, and how it can occur and cause damage to our electronics.

Learn more about the Human Proximity Detection for System Wakeup and Interrupt Reference Design that enables easy evaluation of TI technology.

Roland Sperlich, reviews TI’s SuperSpeed USB Portfolio, which is the Industry’s only complete end–to–end portfolio.

This video provides a brief overview of transient voltage suppressor (TVS) diodes and why they are necessary for protecting integrated circuits.