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Slew rate introduction
日付:
所要時間::
2015年 3月 23日
所要時間::
10:32
In this video we discuss the theory behind slew rate and compare the slew rate and current consumption of different TI amplifiers.
Settling time
日付:
所要時間::
2015年 3月 23日
所要時間::
13:51
In this video we discuss the body effect's impact on slew rate as well as settling time and the difference between large signal and small signal behavior.
Slew rate - Lab
日付:
所要時間::
2015年 3月 23日
所要時間::
06:26
In this training lab we discuss calculations, simulations, and real world measurements that reinforce the concepts in the slew rate video series.
Noise spice simulation
日付:
所要時間::
2015年 3月 23日
所要時間::
10:52
In this video we show how to perform noise simulations using TINA-TI, a free SPICE simulator.
Verifying the noise model
日付:
所要時間::
2015年 3月 23日
所要時間::
07:52
In this video we show a comprehensive method for verifying simulation noise models and creating your own if necessary.
Noise - Lab
日付:
所要時間::
2015年 3月 23日
所要時間::
13:10
In this training lab we discuss calculations, simulations, and real world measurements that reinforce the concepts in the noise video series.
Spice simulation
日付:
所要時間::
2015年 3月 23日
所要時間::
06:30
In this video we explain how to perform open loop simulations in SPICE to obtain rate of closure and phase margin of op amp circuits.
Measuring system stability
日付:
所要時間::
2015年 3月 23日
所要時間::
07:48
In this video we explain how to perform indirect phase margin measurements in SPICE simulation and on the bench.
Capacitive loads
日付:
所要時間::
2015年 3月 23日
所要時間::
06:42
In this video we discuss why capacitive loads cause stability issues and present the isolation resistor compensation technique.
Isolation resistor
日付:
所要時間::
2015年 3月 23日
所要時間::
06:45
In this video we discuss the Riso with dual feedback stability compensation method.
Stability - Lab
日付:
所要時間::
2015年 3月 23日
所要時間::
14:50
In this training lab we discuss calculations, simulations, and real world measurements that reinforce the concepts in the stability video series.
Electrostatic discharge (ESD)
日付:
所要時間::
2015年 3月 23日
所要時間::
12:56
In this video we explain how ESD can damage semiconductor components and introduce internal ESD protection circuits in semiconductor devices.
Testing for robustness
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所要時間::
2015年 3月 23日
所要時間::
11:20
In this video we discuss how a device is damaged by transient electrical energy and introduce the tests used to determine a product's robustness against it.
Phase margin
日付:
所要時間::
2015年 3月 23日
所要時間::
13:04
In this video we provide a review of Bode plots and stability theory using phase margin and rate of closure analysis.
Stability - Introduction
日付:
所要時間::
2015年 3月 23日
所要時間::
08:23
In this video we discuss the common causes of op amp stability issues and how to identify these issues in the lab.
1/F flicker noise
日付:
所要時間::
2015年 3月 23日
所要時間::
16:50
In this video we discuss the details of 1/f or flicker noise.
Measuring system noise
日付:
所要時間::
2015年 3月 23日
所要時間::
15:55
In this video we discuss techniques for measuring noise, including use of the oscilloscope and the spectrum analyzer.
Simplifying calculations
日付:
所要時間::
2015年 3月 23日
所要時間::
16:21
In this video we provide several rules of thumb for simplifying noise calculations by identifying the dominant sources.Learn more about the
Calculating total noise
日付:
所要時間::
2015年 3月 23日
所要時間::
07:49
In this video we continue the noise discussion by performing a full noise calculation for a simple amplifier circuit.
Selecting components
日付:
所要時間::
2015年 3月 23日
所要時間::
10:39
In this video we show how to select components for EOS protection, focusing on TVS diodes and current limiting resistors.