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TI Precision Labs - Op Amps: Electrical Overstress - Testing for robustness

説明

2015年 3月 23日
This is the fourth of four videos in the TI Precision Labs – Op Amps curriculum that addresses operational amplifier electrical overstress (EOS). In this training, we will cover how a device is damaged by the most common types of harmful electrical transients, and the standard tests which are used to determine a product’s robustness against these transients.

PDFs for download

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