12.4 Testing for robustness
説明
2015年 3月 23日
| This is the fourth of four videos in the TI Precision Labs – Op Amps curriculum that addresses operational amplifier electrical overstress (EOS). In this training, we will cover how a device is damaged by the most common types of harmful electrical transients, and the standard tests which are used to determine a product’s robustness against these transients. |
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追加情報
このコースは、次のシリーズに属します
Date: 3月23日2015年
