12.4 TI Precision Labs - Op Amps: Electrical Overstress - Testing for robustness
説明
2015年 3月 23日
This is the fourth of four videos in the TI Precision Labs – Op Amps curriculum that addresses operational amplifier electrical overstress (EOS). In this training, we will cover how a device is damaged by the most common types of harmful electrical transients, and the standard tests which are used to determine a product’s robustness against these transients.
After watching the video, reinforce your learning with the following bonus content:
PDFs for download
Additional information
このコースは、次のシリーズに属します
Date: 3月23日2015年
