TI Robotics System Learning Kit (TI-RSLK)


15.3 TI-RSLK Module 15 - Lab video 15.1 - Testing IR measurements using the ADC


2017년 11월 1일

You will use the ADC to input data into the microcontroller, periodic interrupts to sample the ADC at a regular rate, study the noise generated in the data acquisition system, evaluate a simple digital filter in an attempt to improve signal to noise ratio, which is defined as the signal amplitude divided by the noise amplitude and evaluate the accuracy and resolution of the measurement.

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