TI Precision Labs - Op Amps: Electrical Overstress (EOS)

This series covers the causes of electrical overstress and introduces several methods that can be used to improve and test circuit robustness.

Oops, what's that smell:  why did the "smoke test" fail?

This series covers the causes of electrical overstress and introduces several methods that can be used to improve and test circuit robustness against electrical overstress.  All of the examples in this series show op-amp circuits, but the methods used could be applied to other components as well.

Additional information

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