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3606 Results

TI Precision Labs - Op Amps: ESD

ZAP! Is your circuit protected against the thousands of volts which could be on your finger tips?

This series explains how electrostatic discharge, or ESD, can damage semiconductor components and what kind of internal protection circuitry is present in these devices.

TI Precision Labs - Op Amps: Electrical Overstress (EOS)

Oops, what's that smell:  why did the "smoke test" fail?

This series covers the causes of electrical overstress and introduces several methods that can be used to improve and test circuit robustness against electrical overstress.  All of the examples in this series show op-amp circuits, but the methods used could be applied to other components as well.

TI Precision Labs - Op Amps: Board Level Troubleshooting

My application circuit doesn't work! What should I do now?

This video series gives recommendations for best practice application debugging techniques. Various engineering checks are outlined to help determine the root cause of an issue.

For more detailed amplifier troubleshooting videos, check out the Linear Amplifier Troubleshooting Training Series.

TI Precision Labs - Op Amps: Current-Feedback Amplifiers

What is a current-feedback amplifier, and when is it the best choice for your system design?

In this two-part series, you will learn the main advantages of current-feedback amplifiers, namely:

TI Precision Labs - Op Amps: Comparator Applications

While it may look just like an op amp, the comparator's function is quite different. Do you know the fundamentals of comparator applications?

This video series covers the functionality of the analog comparator and its key dc and ac specifications, how to apply hysteresis to protect against comparator input noise, and the pros and cons of using op amps as comparators.

KeyStone Architecture

This section provides an introduction to the functional architecture of the C66x DSP + ARM embedded processors, as well as the DSP and ARM cores and the Instruction Set Architecture (ISA).

KeyStone Memory and Transport

This section provides information about the memory and transport architectures of the C66x DSP + ARM embedded processors.

KeyStone External Interfaces

This section provides training on the external interfaces of the C66x DSP + ARM embedded processors.

KeyStone Wireless Accelerators and Co-Processors

This section provides an overview of the wireless accelerators and co-processors on C66x DSP + ARM embedded processors.

KeyStone Software and Tools

This section introduces various software and tools on C66x DSP + ARM embedded processors.

KeyStone Demonstrations

This section includes demonstrations for software and hardware processes performed on KeyStone devices.

Processor SDK for TI Embedded Processors

This section provides an overview of the Processor SDK for Linux and RTOS for use on TI embedded processors.

Capacitor selection

This sections covers tips for selecting the appropriate capacitors for your switching power supply.

Inductor selection

This sections covers tips for selecting the appropriate inductors for your switching power supply.

JESD204B Video Blog Series

The JESD204B video blog series explores the basic concepts related to the JESD204B SerDes standard in relation to High Speed Data Converter products.

RF Sampling Series

This series explores the new realm of RF sampling converters for use in high frequency, large bandwidth systems.

Advanced JESD204B Topics

This series explores advanced topics related to the JESD204B SerDes standard associated with extending the link length and multi-device synchronization.

General High-Speed Trainings

This series covers general updates on Texas Instruments' high-speed signal chain portfolio.

Getting Started with Current Sense Amplifiers - The Basics

Section 1 of this training series focuses on the basics of current measurement with current sense amplifiers

Getting Started with Current Sense Amplifiers - Understanding Error Sources

Section 2 of this training series focuses on the understanding the error sources associated with current measurement and the best methods for minimizing these errors.

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