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SPI over LVDS for Test & Measurement applications

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Date: July 16, 2018

This video presents SPI over LVDS implementation for test & measurement applications.

SPI is a common data communication method used between processors and peripheral devices in test & measurement applications. Clean signals are key to accurate measurement. LVDS interface offers high noise immunity, EMI reduction, and the possibility to send SPI signals from PCB to PCB. 

In this video, we present different options on sending SPI over LVDS, an estimated additional PCB area, and a method on solving the round trip delay issue. 

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