TI Precision Labs - Op Amps: Electrical Overstress - Testing for robustness
Description
March 23, 2015
This is the fourth of four videos in the TI Precision Labs – Op Amps curriculum that addresses operational amplifier electrical overstress (EOS). In this training, we will cover how a device is damaged by the most common types of harmful electrical transients, and the standard tests which are used to determine a product’s robustness against these transients.
After watching the video, reinforce your learning with the following bonus content:
PDFs for download
Additional information
This course is also a part of the following series
Date: March 23, 2015
Date: March 23, 2015
