12.4 Testing for robustness
描述
2015年 3月 23日
| This is the fourth of four videos in the TI Precision Labs – Op Amps curriculum that addresses operational amplifier electrical overstress (EOS). In this training, we will cover how a device is damaged by the most common types of harmful electrical transients, and the standard tests which are used to determine a product’s robustness against these transients. |
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其他資訊
This course is also a part of the following series
Date: 三月23日2015年
